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Comparison of electrical properties and deep traps in p-Al[sub x]Ga[sub 1−x]N grown by molecular beam epitaxy and metal organic chemical vapor deposition
Polyakov, A. Y., Smirnov, N. B., Govorkov, A. V., Kozhukhova, E. A., Dabiran, A. M., Chow, P. P., Wowchak, A. M., Lee, In-Hwan, Ju, Jin-Woo, Pearton, S. J.Volume:
106
Year:
2009
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3238508
File:
PDF, 778 KB
english, 2009