Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
2012 Vol. 30; Iss. 4
![](/img/cover-not-exists.png)
Effect of In-Ga-Zn-O active layer channel composition on process temperature for flexible oxide thin-film transistors
Bak, Jun Yong, Yoon, Sung Min, Yang, Shinhyuk, Kim, Gi Heon, Ko Park, Sang-Hee, Hwang, Chi-SunVolume:
30
Year:
2012
Language:
english
Journal:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
DOI:
10.1116/1.4731257
File:
PDF, 1.66 MB
english, 2012