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[IEEE 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Austin, TX, USA (2010.05.3-2010.05.6)] 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Maximizing precision over extended unambiguous range for TOF range imaging systems
Jongenelen, Adrian P. P., Carnegie, Dale A., Payne, Andrew D., Dorrington, Adrian A.Year:
2010
Language:
english
DOI:
10.1109/imtc.2010.5488178
File:
PDF, 612 KB
english, 2010