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Photoluminescence of Frank-type defects on the basal plane in 4H–SiC epilayers
Kamata, Isaho, Zhang, Xuan, Tsuchida, HidekazuVolume:
97
Year:
2010
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.3499431
File:
PDF, 737 KB
english, 2010