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[IEEE 2005 8th European Conference on Radiation and Its Effects on Components and Systems - Cap d'Agde, France (2005.09.19-2005.09.23)] 2005 8th European Conference on Radiation and Its Effects on Components and Systems - Characterization of Upset-induced Degradation of Error-mitigated Highspeed I/O's Using Fault Injection
Rezgui, Sana, Swift, Gary M., Lesea, AustinYear:
2005
Language:
english
DOI:
10.1109/radecs.2005.4365642
File:
PDF, 3.22 MB
english, 2005