Ion-implanted charge collection contacts for high purity...

Ion-implanted charge collection contacts for high purity silicon detectors operated at 20 mK

Young, B. A., Yu, K. M.
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Volume:
66
Year:
1995
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1145599
File:
PDF, 1.03 MB
english, 1995
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