Electron temperature and fluctuation correlation measurements using dual analyzers with a heavy ion beam probe
Michael, J. D., Saravia, E., Hickok, R. L., Jennings, W. C.Volume:
57
Year:
1986
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1139142
File:
PDF, 481 KB
english, 1986