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[IEEE IEEE International Symposium on Circuits and Systems - New Orleans, LA, USA (1-3 May 1990)] IEEE International Symposium on Circuits and Systems - IC spot-defect and fault semantics-a unified framework
Pineda de Gyvez, J., Jess, J.A.G.Year:
1990
Language:
english
DOI:
10.1109/iscas.1990.112569
File:
PDF, 505 KB
english, 1990