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[IEEE 2010 IEEE International Conference on Industrial Technology - Vi a del Mar , Chile (2010.03.14-2010.03.17)] 2010 IEEE International Conference on Industrial Technology - Analysis of the applicability of RFID & wireless sensors to manufacturing and distribution lines trough a testing multi-platform
G.-Escribano, Javier, Garcia, Andres, Wissendheit, Uwe, Loffler, Andreas, Pastor, Jose ManuelYear:
2010
Language:
english
DOI:
10.1109/icit.2010.5472510
File:
PDF, 857 KB
english, 2010