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Ohmic contact probed by dark injection space-charge-limited current measurements
Koo, Young-Mo, Choi, Sung-Jin, Chu, Ta-Ya, Song, Ok-Keun, Shin, Won-Ju, Lee, Je-Yun, Kim, Jae Chang, Yoon, Tae-HoonVolume:
104
Year:
2008
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3043880
File:
PDF, 549 KB
english, 2008