Correlation between structure, microstructure, and ferroelectric properties of PbZr[sub 0.2]Ti[sub 0.8]O[sub 3] integrated film: Influence of the sol-gel process and the substrate
Floquet, Nicole, Hector, Jérôme, Gaucher, PhilippeVolume:
84
Year:
1998
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.368560
File:
PDF, 1.16 MB
english, 1998