Nanometer-scale modification and characterization of...

Nanometer-scale modification and characterization of lead-telluride surface by scanning tunneling microscope at 4.2 K

Davydov, D. N., Lyanda-Geller, Yu. B., Rykov, S. A., Hancotte, H., Deltour, R., Jansen, A. G. M., Wyder, P.
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Volume:
79
Year:
1996
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.361171
File:
PDF, 346 KB
english, 1996
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