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Reactive ZnO/Ti/ZnO interfaces studied by hard x-ray photoelectron spectroscopy
Knut, Ronny, Lindblad, Rebecka, Grachev, Sergey, Faou, Jean-Yvon, Gorgoi, Mihaela, Rensmo, Håkan, Søndergård, Elin, Karis, OlofVolume:
115
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4854636
Date:
January, 2014
File:
PDF, 1.51 MB
english, 2014