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[IEEE 2013 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE) - Chengdu, China (2013.07.15-2013.07.18)] 2013 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE) - The reliability of the process of lifetest of the Aerospace Photoconductive Infrared Detector
Zhang, Hai-Yan, Zhuang, Fu-Long, Li, Yan-Jin, Gong, Hai-MeiYear:
2013
Language:
english
DOI:
10.1109/qr2mse.2013.6625737
File:
PDF, 1.41 MB
english, 2013