X-Ray Yield and Line∕Background Ratios for Electron Excitation
Birks, L. S., Seebold, R. E., Grant, B. K., Grosso, J. S.Volume:
36
Year:
1965
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1714204
File:
PDF, 482 KB
english, 1965