Field-effect passivation and degradation analyzed with photoconductance decay measurements
Chen, Yi-Yang, Korte, Lars, Rech, Bernd, Hsin, Pi-Yu, Du, Chen-Hsu, Gan, Jon-YiewVolume:
104
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.4876126
Date:
May, 2014
File:
PDF, 736 KB
english, 2014