Characterization of Al/CuO nanoenergetic multilayer films...

Journal of Applied Physics 2013 Vol. 113; Iss. 18

Characterization of Al/CuO nanoenergetic multilayer films integrated with semiconductor bridge for initiator applications

Zhu, Peng, Shen, Ruiqi, Ye, Yinghua, Fu, Shuai, Li, Dongle
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Volume:
113
Year:
2013
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4804315
File:
PDF, 1.22 MB
english, 2013
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