Circular mode: A new scanning probe microscopy method for...

Circular mode: A new scanning probe microscopy method for investigating surface properties at constant and continuous scanning velocities

Nasrallah, Hussein, Mazeran, Pierre-Emmanuel, Noël, Olivier
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Volume:
82
Year:
2011
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.3658049
File:
PDF, 760 KB
english, 2011
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