![](/img/cover-not-exists.png)
Circular mode: A new scanning probe microscopy method for investigating surface properties at constant and continuous scanning velocities
Nasrallah, Hussein, Mazeran, Pierre-Emmanuel, Noël, OlivierVolume:
82
Year:
2011
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.3658049
File:
PDF, 760 KB
english, 2011