[IEEE 2011 8th IEEE International Symposium on Diagnostics for Electric Machines, Power Electronics and Drives - (SDEMPED 2011) - Bologna, Italy (2011.09.5-2011.09.8)] 8th IEEE Symposium on Diagnostics for Electrical Machines, Power Electronics & Drives - Electrical aging tests on different nanostructured enamels subjected to severe voltage waveforms
Guastavino, Francesco, Ratto, Alessandro, Torello, Eugenia, Biondi, Giovanna, Loggi, Giovanni, Ceci, AndreaYear:
2011
Language:
english
DOI:
10.1109/demped.2011.6063636
File:
PDF, 108 KB
english, 2011