Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
2011 Vol. 29; Iss. 4
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Interface stability in stressed solid-phase epitaxial growth
Morarka, S., Jin, S., Rudawski, N. G., Jones, K. S., Law, M. E., Elliman, R. G.Volume:
29
Year:
2011
Language:
english
Journal:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
DOI:
10.1116/1.3610172
File:
PDF, 449 KB
english, 2011