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[IEEE 2011 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2011.04.10-2011.04.14)] 2011 International Reliability Physics Symposium - Electron beam induced current characterization of dark line defects in failed and degraded high power quantum well laser diodes
Mason, Maribeth, Presser, Nathan, Sin, Yongkun, Foran, Brendan, Moss, Steven C.Year:
2011
Language:
english
DOI:
10.1109/irps.2011.5784526
File:
PDF, 4.96 MB
english, 2011