Behavior of ion-implanted As atoms in Si during molybdenum disilicide formation
Ohdomari, Iwao, Chikyow, Toyohiro, Kawarada, Hiroshi, Konuma, Kazuo, Kakumu, Masakazu, Hashimoto, Kazuhiko, Kimura, Itsuro, Yoneda, KenjiVolume:
59
Year:
1986
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.336930
File:
PDF, 532 KB
english, 1986