X-ray photoelectron spectroscopy analysis and band offset...

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 2014 / 01 Vol. 32; Iss. 1

X-ray photoelectron spectroscopy analysis and band offset determination of CeO2 deposited on epitaxial (100), (110), and (111)Ge

Zhu, Yan, Jain, Nikhil, Hudait, Mantu K., Maurya, Deepam, Varghese, Ronnie, Priya, Shashank
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Volume:
32
Language:
english
Journal:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
DOI:
10.1116/1.4862160
Date:
January, 2014
File:
PDF, 5.05 MB
english, 2014
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