![](/img/cover-not-exists.png)
[Int. Test. Conference IEEE Computer Society International Test Conference (ICSM'99) - Atlantic City, NJ, USA (28-30 Sept. 1999)] International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034) - Silicon debug: scan chains alone are not enough
Van Rootselaar, G.J., Vermeulen, B.Year:
1999
Language:
english
DOI:
10.1109/test.1999.805821
File:
PDF, 1010 KB
english, 1999