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[Int. Test. Conference IEEE Computer Society International Test Conference (ICSM'99) - Atlantic City, NJ, USA (28-30 Sept. 1999)] International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034) - Silicon debug: scan chains alone are not enough

Van Rootselaar, G.J., Vermeulen, B.
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Year:
1999
Language:
english
DOI:
10.1109/test.1999.805821
File:
PDF, 1010 KB
english, 1999
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