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Thin conductive diamond films as beam intensity monitors for soft x-ray beamlines
Kummer, K., Fondacaro, A., Yakhou-Harris, F., Sessi, V., Pobedinskas, P., Janssens, S. D., Haenen, K., Williams, O. A., Hees, J., Brookes, N. B.Volume:
84
Year:
2013
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.4794439
File:
PDF, 1.52 MB
english, 2013