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Growth textures of thick sputtered films and multilayers assessed via synchrotron transmission Laue
Vill, M. A., Rek, Z. U., Yalisove, S. M., Bilello, J. C.Volume:
78
Year:
1995
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.360746
File:
PDF, 1.28 MB
english, 1995