A unified framework for EIV identification methods when the measurement noises are mutually correlated
Söderström, Torsten, Diversi, Roberto, Soverini, UmbertoVolume:
50
Language:
english
Journal:
Automatica
DOI:
10.1016/j.automatica.2014.10.037
Date:
December, 2014
File:
PDF, 508 KB
english, 2014