[IEEE 2007 IEEE/MTT-S International Microwave Symposium - Honolulu, HI, USA (2007.06.3-2007.06.8)] 2007 IEEE/MTT-S International Microwave Symposium - Frequency Deviation Due to a Sample Insertion Hole in a Cylindrical Cavity by Circuital Analysis
Penaranda-Foix, Felipe L., Catala-Civera, Jose M., Canos-Marin, Antoni J., Garcia-Banos, BeatrizYear:
2007
Language:
english
DOI:
10.1109/mwsym.2007.380030
File:
PDF, 2.01 MB
english, 2007