Visualizing charge transport in silicon nanocrystals embedded in SiO[sub 2] films with electrostatic force microscopy
Ng, C. Y., Chen, T. P., Lau, H. W., Liu, Y., Tse, M. S., Tan, O. K., Lim, V. S. W.Volume:
85
Year:
2004
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.1801675
File:
PDF, 513 KB
english, 2004