[IEEE 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings - Shanghai, China (2006.10.23-2006.10.26)] 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings - Drain Disturb Related to Negative VB in NOR flash
Kai, Shi, Mingzhen, Xu, Changhua, TanYear:
2006
Language:
english
DOI:
10.1109/icsict.2006.306514
File:
PDF, 113 KB
english, 2006