[IEEE 2014 IEEE International Ultrasonics Symposium (IUS) -...

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[IEEE 2014 IEEE International Ultrasonics Symposium (IUS) - Chicago, IL, USA (2014.9.3-2014.9.6)] 2014 IEEE International Ultrasonics Symposium - Application of SAW RFID in the inspection management of aerodrome lights

Shi, Ruchuan, Zhang, Chenrui, Han, Tao, Chen, Jing
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Year:
2014
Language:
english
DOI:
10.1109/ultsym.2014.0634
File:
PDF, 945 KB
english, 2014
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