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[IEEE 2010 35th IEEE Photovoltaic Specialists Conference (PVSC) - Honolulu, HI, USA (2010.06.20-2010.06.25)] 2010 35th IEEE Photovoltaic Specialists Conference - RF-sputtered ITO and ITO:Zr studied by in situ spectroscopic ellipsometry
Burst, James M., Peshek, Timothy J., Gessert, Timothy A., Coutts, Timothy J., Li, XiaoNan, Levi, Dean, Weiss, Sharon M., Rogers, Bridget R.Year:
2010
Language:
english
DOI:
10.1109/pvsc.2010.5614289
File:
PDF, 2.43 MB
english, 2010