Backscattering analyzer geometry as a straightforward and precise method for monochromator characterization at third-generation synchrotron-radiation sources (abstract)
Snigirev, A. A., Lequien, S., Suvorov, A. Yu.Volume:
66
Year:
1995
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1145714
File:
PDF, 360 KB
english, 1995