Modulated shear–force distance control in near-field...

Review of Scientific Instruments 2000 Vol. 71; Iss. 3

Modulated shear–force distance control in near-field scanning optical microscopy

Brunner, R., Simon, A., Stifter, T., Marti, O.
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Volume:
71
Year:
2000
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1150481
File:
PDF, 756 KB
english, 2000
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