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[IEEE 2010 IEEE Workshop on Microelectronics and Electron Devices (WMED) - Boise, ID, USA (2010.04.16-2010.04.16)] 2010 IEEE Workshop on Microelectronics and Electron Devices - Modified Floating Gate and IPD Profile for Better Cell Performance of Sub-50 nm NAND Flash Memory
Liu, Jennifer Lequn, Gonzalez, Fernando, Hu, Y. Jeff, Yu, Jixin, Srinivasan, Charan, Hill, ErvinYear:
2010
Language:
english
DOI:
10.1109/wmed.2010.5453752
File:
PDF, 475 KB
english, 2010