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[IEEE 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings - Shanghai, China (2006.10.23-2006.10.26)] 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings - Investigation of Surface Charging Effects in AlGaN/GaN HEMT by a New Measurement Method
Luo, Qian, Du, Jiangfeng, Yang, Mohua, Lu, Shenghui, Zhou, Wei, Xia, Jianxin, Yu, QiYear:
2006
Language:
english
DOI:
10.1109/icsict.2006.306595
File:
PDF, 97 KB
english, 2006