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Field Decay and Snapback Measurements Using a Fast Hall Probe Sensor
Pieloni, T., Sanfilippo, S., Bottura, L., Haverkamp, M., Tikhov, A., Effinger, E., Benedico, E., Smirnov, N.Volume:
14
Language:
english
Journal:
IEEE Transactions on Appiled Superconductivity
DOI:
10.1109/tasc.2004.830871
Date:
June, 2004
File:
PDF, 227 KB
english, 2004