Field Decay and Snapback Measurements Using a Fast Hall...

IEEE Transactions on Appiled Superconductivity 2004 / 06 Vol. 14; Iss. 2

Field Decay and Snapback Measurements Using a Fast Hall Probe Sensor

Pieloni, T., Sanfilippo, S., Bottura, L., Haverkamp, M., Tikhov, A., Effinger, E., Benedico, E., Smirnov, N.
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Volume:
14
Language:
english
Journal:
IEEE Transactions on Appiled Superconductivity
DOI:
10.1109/tasc.2004.830871
Date:
June, 2004
File:
PDF, 227 KB
english, 2004
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