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[IEEE 2005 IEEE International Symposium on Circuits and Systems - Kobe, Japan (23-26 May 2005)] 2005 IEEE International Symposium on Circuits and Systems - Use of Source Degeneration for Non-Intrusive BIST of RF Front-end Circuits
Gopalan, A., Das, T., Washburn, C., Mukund, P.R.Year:
2005
Language:
english
DOI:
10.1109/iscas.2005.1465603
File:
PDF, 306 KB
english, 2005