Extended Arrhenius law of time-to-breakdown of ultrathin...

Extended Arrhenius law of time-to-breakdown of ultrathin gate oxides

Xu, Mingzhen, Tan, Changhua, Li, MingFu
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Volume:
82
Year:
2003
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.1566460
File:
PDF, 239 KB
english, 2003
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