[IEEE 2008 American Control Conference (ACC '08) - Seattle, WA (2008.06.11-2008.06.13)] 2008 American Control Conference - Prediction of batch quality indices using functional space approximation and partial least squares
Ramprasad, Y., Patel, Shailesh, Ryali, Srikanth, Gudi, RaviYear:
2008
Language:
english
DOI:
10.1109/acc.2008.4587208
File:
PDF, 208 KB
english, 2008