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Contribution of defects to electronic, structural, and thermodynamic properties of amorphous silicon
Stolk, P. A., Saris, F. W., Berntsen, A. J. M., Weg, W. F. van der, Sealy, L. T., Barklie, R. C., Krötz, G., Müller, G.Volume:
75
Year:
1994
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.356662
File:
PDF, 2.97 MB
english, 1994