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[IEEE 2014 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) - Columbus, OH, USA (2014.6.23-2014.6.28)] 2014 IEEE Conference on Computer Vision and Pattern Recognition - Bayesian Active Appearance Models
Alabort-i-Medina, Joan, Zafeiriou, StefanosYear:
2014
Language:
english
DOI:
10.1109/cvpr.2014.439
File:
PDF, 1.05 MB
english, 2014