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Interpretation of capacitance versus voltage measurements in the presence of a high density of deep levels
Shiau, Jeng-Jye, Fahrenbruch, Alan L., Bube, Richard H.Volume:
59
Year:
1986
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.336946
File:
PDF, 603 KB
english, 1986