Nucleation of HfO[sub 2] atomic layer deposition films on chemical oxide and H-terminated Si
Hackley, Justin C., Gougousi, Theodosia, Demaree, J. DerekVolume:
102
Year:
2007
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.2764223
File:
PDF, 1.00 MB
english, 2007