Formation mechanism of defects around the Y211 inclusion...

IEEE Transactions on Appiled Superconductivity 1997 / 6 Vol. 7; Iss. 2

Formation mechanism of defects around the Y211 inclusion trapped within the melt-textured Y123 domain

Gye-Won Hong,, Ki-Baik Kim,, Il-Hyun Kuk,, Chan-Joong Kim,, Yi-Sung Lee,, Hyun-Soon Park,
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Volume:
7
Language:
english
Journal:
IEEE Transactions on Appiled Superconductivity
DOI:
10.1109/77.620967
Date:
June, 1997
File:
PDF, 430 KB
english, 1997
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