[Int. Test Conference International Test Conference 1997 -...

[Int. Test Conference International Test Conference 1997 - Washington, DC, USA (1-6 Nov. 1997)] Proceedings International Test Conference 1997 - DS-LFSR: a new BIST TPG for low heat dissipation

Seongmoon Wang,, Gupta, S.K.

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Year:

1997

Language:

english

DOI:

10.1109/test.1997.639699

File:

PDF, 1024 KB

english, 1997

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