![](/img/cover-not-exists.png)
[IEEE 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Xian, China (2012.10.29-2012.11.1)] 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology - Quality improvement of IDSS in deep trench superjunction power VDMOSFET
Wang, Yung-Cheng, Fan, Zeng-Yi, Yao, Liang, Wang, Fei, Zhang, Chao-Yang, Liao, Scott, Li, Po, Huang, Yi-PingYear:
2012
Language:
english
DOI:
10.1109/icsict.2012.6467623
File:
PDF, 1.17 MB
english, 2012