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Displacement damage effects on CMOS APS image sensors induced by neutron irradiation from a nuclear reactor
Wang, Zujun, Huang, Shaoyan, Liu, Minbo, Xiao, Zhigang, He, Baoping, Yao, Zhibin, Sheng, JiangkunVolume:
4
Language:
english
Journal:
AIP Advances
DOI:
10.1063/1.4889878
Date:
July, 2014
File:
PDF, 1.43 MB
english, 2014