[IEEE 52nd Electronic Components and Technology Conference - San Diego, CA, USA (28-31 May 2002)] 52nd Electronic Components and Technology Conference 2002. (Cat. No.02CH37345) - Experimental investigation on the progressive failure mechanism of solder balls during ball shear test
Xingjia Huang,, Lee, S.W.R., Chien Chun Yan,Year:
2002
Language:
english
DOI:
10.1109/ectc.2002.1008218
File:
PDF, 879 KB
english, 2002