[IEEE 2011 International Conference on Electronics,...

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[IEEE 2011 International Conference on Electronics, Communications and Control (ICECC) - Ningbo, China (2011.09.9-2011.09.11)] 2011 International Conference on Electronics, Communications and Control (ICECC) - Testability design of multi-valued RTD circuits

Mi, Lin, Haipeng, Zhang, Lingling, Sun
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Year:
2011
Language:
english
DOI:
10.1109/icecc.2011.6067730
File:
PDF, 325 KB
english, 2011
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